@article{oai:toyama.repo.nii.ac.jp:00006490,
 author = {鳥養, 祐二 and 村田, 大樹 and 渡辺, 国昭 and 松山, 政夫 and Perevezentsev, A},
 journal = {富山大学水素同位体科学研究センター研究報告 = Annual Report of Hydrogen Isotope Research Center, Toyama University},
 month = {},
 note = {application/pdf, Depth profiles of tritium in stainless steel type 316 loaded at several different conditions at JET were analyzed by β-ray-induced X-ray spectrometry (BIXS), in order to investigate the possibilities of the measurement method. The tritium depth profiles obtained by BIXS were compared with that obtained by chemical etching and radioluminography (RLG) methods. It was found that most of tritium depth profiles near surface (up to ?2μm) obtained by BIXS were in good accordance with chemical etching and RLG methods. In the same time significant difference between BIXS and RLG was found in determination of tritium depth profiles in the sub-surface layer. The reasons for the deviations will be discussed., Article},
 pages = {29--39},
 title = {BIXS法のトリチウム汚染材料計測への応用},
 volume = {24},
 year = {2004}
}